抗振干涉测量
观看:DynaPhase™ 动态数据采集
在极端振动、实时光学系统对准等动态环境下的干涉光学测量
菲索干涉测量法已经成为用于精确测量光学元件和系统的一种公认的标准方法。传统上,这些仪器需要安装在实验室环境中,因为在实验室环境中,各种条件受到精心控制,可以确保高精度的测量结果。然而,如今越来越多的应用需要一种简单、经济高效的解决方案,要求在以前不可能获得高质量计量结果的环境中使用干涉测量法。
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![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0007-tn.png?revision=1542a4dc-6c20-48ad-b055-cb3eaf5c0d35)
Measurement of Aspheric Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0008-tn.png?revision=2baf0664-3248-490d-aca3-de59b01d2173)
Determining Asphere Measurability
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0010-tn.png?revision=44bcfb71-244a-422d-b5b7-7b6cc7ab52dc)
Grazing Incidence Testing
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0015-tn.png?revision=98099967-e3b4-4896-aecd-4a4792832921)
Interferogram Scale Factor
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0016-tn.png?revision=ad50046f-941f-4b20-8ebe-9c66d914f1ca)
Silver Overcoat Spray
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0017-tn.png?revision=accc0554-fb6e-477d-8615-b03318e01626)
Testing Cylindrical Surfaces with Computer Generated Holograms
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0018-tn.png?revision=056c98eb-082e-49bb-a883-9f8e96e1c807)
Fringe Analysis versus Phase Measuring Interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0019-tn.png?revision=9988b739-d6d1-451d-9743-a81b3f007eac)
Finite Conjugate Lens Testing
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![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Solutions for environmentally robust interferometric optical testing
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
101 Frame Algorithm For Phase Shifting Interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A next-generation optical surface form inspection instrument for high-volume production applications
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A review of selected topics in interferometric optical metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute distance measurements using FTPSI with a widely tunable IR laser
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute Interferometric Testing of Spherical Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute Measurement of Rotationally Symmetrical Aspheric Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Adjustable coherence depth in a geometrically-desensitized interferometer
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A next-generation optical surface form inspection instrument for high-volume production applications
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