QPSI 技术
![](/-/media/project/ameteksxa/zygo/ametekzygo/support/technologies/qpsi/qpsianimation2.gif?dmc=1&revision=7086ac1c-b017-416f-adf2-4d9ec1983b8f&h=279&w=280&la=zh-cn&hash=9F9DB5C89084CB13679EC954741C873C)
PSI 测量(可以看到振动导致的条纹透印)和使用 QPSI™ 技术测量的相同表面(无噪声透印)的动画对比。
ZYGO 的 QPSI™ 专有技术是真正的精密光学测试领域的一大突破,与噪声太大的传统 PSI 采集方法相比,它消除了因微小振动而产生的相位数据中的噪声和纹波,提供了可靠的数据。QPSI 测量不需要特殊的设置或校准,测量时间与标准 PSI 测量差不多。
QPSI 是 ZYGO 的独有技术,是 Verifire、DynaFiz、Verifire HD、Verifire MST 以及许多红外和大口径干涉仪的标准配置。这些系统是易于使用、同轴、共光路的菲索干涉仪,树立了可靠计量的行业典范,是大多数光学表面面形轮廓和透射波前测量的理想选择。
-
更多信息
-
应用
指南 -
技术论文
-
视频
采用 QPSI 技术的 ZYGO 干涉仪可以在由电机、泵、鼓风机和人员等引起的常见振动下进行可靠的高精度测量。
荣获专有技术的轴上时间相移采集是通过独特的软件算法以及 ZYGO 制造的 HeNe 激光器来实现的,HeNe 激光器提供了更高的功率,可逐帧减少振动。
主要特点:
- 消除因振动而产生的波纹和条纹透印
- 高精度测量;与相移干涉测量技术(PSI)相同
- 不需要校准,也不需要改变您的设置
- 只需点击鼠标即可轻松启用/禁用
- 集成在所有标准的 ZYGO 干涉仪主机中
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0007-tn.png?revision=1542a4dc-6c20-48ad-b055-cb3eaf5c0d35)
Measurement of Aspheric Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0008-tn.png?revision=2baf0664-3248-490d-aca3-de59b01d2173)
Determining Asphere Measurability
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0010-tn.png?revision=44bcfb71-244a-422d-b5b7-7b6cc7ab52dc)
Grazing Incidence Testing
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0015-tn.png?revision=98099967-e3b4-4896-aecd-4a4792832921)
Interferogram Scale Factor
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0016-tn.png?revision=ad50046f-941f-4b20-8ebe-9c66d914f1ca)
Silver Overcoat Spray
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0017-tn.png?revision=accc0554-fb6e-477d-8615-b03318e01626)
Testing Cylindrical Surfaces with Computer Generated Holograms
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0018-tn.png?revision=056c98eb-082e-49bb-a883-9f8e96e1c807)
Fringe Analysis versus Phase Measuring Interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0019-tn.png?revision=9988b739-d6d1-451d-9743-a81b3f007eac)
Finite Conjugate Lens Testing
标题
文件
下载链接
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Solutions for environmentally robust interferometric optical testing
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
101 Frame Algorithm For Phase Shifting Interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A next-generation optical surface form inspection instrument for high-volume production applications
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A review of selected topics in interferometric optical metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute distance measurements using FTPSI with a widely tunable IR laser
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute Interferometric Testing of Spherical Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Absolute Measurement of Rotationally Symmetrical Aspheric Surfaces
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Adjustable coherence depth in a geometrically-desensitized interferometer
标题
文件
下载链接
A next-generation optical surface form inspection instrument for high-volume production applications
Document技术论文
下载链接 下载