Guardian™ 工业机箱
在车间使用 ZYGO 光学轮廓仪来优化效率。
现在您可以在充满挑战的环境条件下满足最严格的精密计量标准。我们的 Guardian™ 机箱将计量核心设备与周围环境隔离开来,使您能够随时随地获得最佳性能。Guardian™ 机箱性能优异、经久耐用,由 ZYGO 专门为我们的光学轮廓仪设计和制造。
人体工程学设计
该系统被设计成一个独立的设备,可以站着或坐着操作。所有的用户界面外围设备都可以被定位和调整。前面的大开口使装卸测试部件和夹具的工作变得简单又快捷。设备的内部照明也可以在需要时照亮工作区域。为了方便维修,设备周围还设置了检修板。
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更多信息
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宣传册和
规格表 -
应用
指南 -
使用手册
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技术论文
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视频
![Gua](/-/media/project/ameteksxa/zygo/ametekzygo/products/3d-optical-profilers/industrial-enclosure-shop-floor.jpg?dmc=1&revision=b12b53aa-ea49-4cd1-9f4f-fab4306c8162&h=248&w=550&hash=CB7EB624D45EC4C84158864429D6E28E)
用于 ZYGO 三维光学轮廓仪的 Guardian™ 工业机箱经久耐用、符合人体工程学且结构紧凑,可在恶劣环境下提供保护,同时保持性能和功能的完整性。
主要特点:
- 与周围环境隔离的计量核心设备
- 占地面积小
- 消音侧板
- 符合人体工程学的控件
- 带盖的大门
- 可拆卸的盖板,便于维修
- 工作区照明
- 电子器件冷却
- 过硬的制造和加工质量
- 专为 ZYGO 光学轮廓仪设计和制造
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0001-tn.png?la=zh-cn&revision=96b84d45-6576-47cf-9bcd-86e7c51f9d6b)
Mx™ Software Films Analysis
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0002-tn.png?revision=df516a0d-ca09-4cf3-a6eb-19bca0a62aba)
Measuring Sub-Angstrom Surface Texture
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0003-tn.png?revision=be11ed51-7c52-404d-a328-f47ed965bde0)
Measuring Dynamic MEMS Devices
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0006-tn.png?revision=27c88de7-86cf-4cdf-90eb-1f48279e15d7)
Identifying and Controlling Vibration
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0009-tn.png?revision=e8329136-dd23-4005-894f-8187215fd3bd)
PSD Analysis
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0011-tn.png?revision=6b881c96-92b3-498f-a0e7-ea1ef56ede54)
Vision Software Suite
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0012-tn.png?revision=644e8e10-f23c-4549-9c41-9b13abf5a0ae)
ABS Geometry and MetroPro® Calculations
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0013-tn.png?revision=2d88ca3d-fdf0-48bb-80a3-114b0fee00d0)
Getting the Most from the Advanced Texture Application
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0014-tn.png?revision=927381cc-ade0-4b17-b907-27ef7dfdb520)
Filtering on the NewView™
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0041-tn.png?revision=7f0c4a86-a8ce-4eb0-b19d-05c3e85cdf9b)
Haze Controls Thin Film PV Performance
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0044-tn.png?revision=24c6bc68-9774-4c7a-a278-bd858cc1f71b)
Photovoltaic Panel Measurement on a NewView™
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0052-tn.png?revision=bf0ae3ee-004c-4633-865c-19ad44263553)
Measuring with an Optical Diverter on a NewView
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0053-tn.png?revision=ec920de6-7ba3-4437-a7ad-9e75758c9052)
Measuring Honed Surfaces with a NewView
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0100-tn.png?revision=32695039-c7aa-498e-9134-df49261a72d9)
Diesel Fuel Injector Metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an0103-tn.png?la=zh-cn&revision=b1c4d4b5-0088-47e4-b515-b3a4defb7e04)
高坡度表面的光学剖面测量
标题
文件
下载链接
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A new class of wide-field objectives for 3D interference microscopy
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Accurate, repetitive, linear motion from biased piezoelectric actuators
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Advanced Metrology for Energy Efficiency
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Advances in optical metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Applications of model-based transparent surface films analysis using coherence scanning interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
标题
文件
下载链接
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
Document技术论文
下载链接 下载
Applications of model-based transparent surface films analysis using coherence scanning interferometry
Document技术论文
下载链接 下载
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Document技术论文
下载链接 下载
Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
Document技术论文
下载链接 下载