Compass™ 2
![3d optical profiler compass 2 3d optical profiler compass 2](/-/media/project/ameteksxa/zygo/ametekzygo/products/3d-optical-profilers/compass-2.jpg?revision=182cd0f2-fa36-4b19-8b71-292c2011de6d&h=350&w=400&la=zh-cn&hash=3D0D73428B00D960FDC8F313688572BC)
ZYGO的Compass™2计量系统为小透镜及其制造模仁的自动化计量设定了基准;这些小透镜广泛应用于智能手机、平板电脑和汽车视觉系统中,Compass2为其制程控制,设定了自动化,非接触,3D表面计量等等基准。其核心是ZYGO的相干扫描干涉技术(CSI),它保证了在可重复性计量和生产过程控制中,提供业界领先的精度、多功能性和速度。
根据需求,有两种型号的Compass 2™ 系统可选
- Compass 2™ - ZYGO的全面解决方案;用于精密测量微透镜的表面面形、设计偏差和关联尺寸等等参数结果。当您需要详尽测量和分析旋转对称球面和非球面、截边镜片和自由曲面时,Compass 2™ 是理想的选择。
- Compass RT - 一个快速灵活,用于精密测量小透镜关联尺寸参数的系统,以及常用的轮廓仪测量应用。当不需要测量面形及设计偏差时,这是理想的选择。
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更多信息
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宣传册和
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应用
指南 -
使用手册
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技术论文
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视频
经过生产验证的技术
Compass 2系统的核心是ZYGO基于CSI的光学轮廓仪技术,它为可重复计量和生产过程控制提供了行业领先的精度、多功能性和速度。Compass™和Compass™ RT的独特之处在于非球面形状和偏差计量以及对准特征的关系/尺寸计量
形状和偏差
- 球面、非球面和自由曲面镜片和模具的全表面、非接触、三维测绘,具有亚纳米级的精度
- 对设计处方的形状偏差的高级分析
- 与钻石切削机的数据整合,以进行表面修正
![镜头到基准面的表征](/-/media/project/ameteksxa/zygo/ametekzygo/products/3d-optical-profilers/lensdatumcharacterization_lg.jpg?dmc=1&h=312&w=400&revision=c40f3a60-2c3e-4ddc-ae0f-9ef37cdbe91f&hash=AA5B6C95C283E0F3995A1F0C28AC2FC1)
关系/尺寸计量学
- 对单面或双面透镜元件的机械设计特征进行定量计量和检测,包括基准到基准和透镜到基准的特性分析
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0001-tn.png?la=zh-cn&revision=96b84d45-6576-47cf-9bcd-86e7c51f9d6b)
Mx™ Software Films Analysis
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0002-tn.png?revision=df516a0d-ca09-4cf3-a6eb-19bca0a62aba)
Measuring Sub-Angstrom Surface Texture
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0003-tn.png?revision=be11ed51-7c52-404d-a328-f47ed965bde0)
Measuring Dynamic MEMS Devices
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0006-tn.png?revision=27c88de7-86cf-4cdf-90eb-1f48279e15d7)
Identifying and Controlling Vibration
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/interferometers/an-0009-tn.png?revision=e8329136-dd23-4005-894f-8187215fd3bd)
PSD Analysis
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0011-tn.png?revision=6b881c96-92b3-498f-a0e7-ea1ef56ede54)
Vision Software Suite
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0012-tn.png?revision=644e8e10-f23c-4549-9c41-9b13abf5a0ae)
ABS Geometry and MetroPro® Calculations
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0013-tn.png?revision=2d88ca3d-fdf0-48bb-80a3-114b0fee00d0)
Getting the Most from the Advanced Texture Application
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0014-tn.png?revision=927381cc-ade0-4b17-b907-27ef7dfdb520)
Filtering on the NewView™
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0041-tn.png?revision=7f0c4a86-a8ce-4eb0-b19d-05c3e85cdf9b)
Haze Controls Thin Film PV Performance
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0044-tn.png?revision=24c6bc68-9774-4c7a-a278-bd858cc1f71b)
Photovoltaic Panel Measurement on a NewView™
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0052-tn.png?revision=bf0ae3ee-004c-4633-865c-19ad44263553)
Measuring with an Optical Diverter on a NewView
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0053-tn.png?revision=ec920de6-7ba3-4437-a7ad-9e75758c9052)
Measuring Honed Surfaces with a NewView
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an-0100-tn.png?revision=32695039-c7aa-498e-9134-df49261a72d9)
Diesel Fuel Injector Metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/app-note-thumbnails/profilers/an0103-tn.png?la=zh-cn&revision=b1c4d4b5-0088-47e4-b515-b3a4defb7e04)
高坡度表面的光学剖面测量
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![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
A new class of wide-field objectives for 3D interference microscopy
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Accurate, repetitive, linear motion from biased piezoelectric actuators
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Advanced Metrology for Energy Efficiency
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Advances in optical metrology
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Applications of model-based transparent surface films analysis using coherence scanning interferometry
![img1](/-/media/project/ameteksxa/zygo/ametekzygo/thumbnail-images/tech-paper-thumbnails/tech-paper-generic-tn.png?la=zh-cn&revision=d775c727-1b39-44b2-8a53-3a3d58ff131d)
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
Document技术论文
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Document技术论文
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
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