NewView™ 9000

The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.

At the core of the system is ZYGO's Coherence Scanning Interferometry (CSI) technology which delivers sub-nanometer precision at all magnifications, and measures a wider range of surfaces faster and more precisely than other commercially-available technologies, thus optimizing your return on investment.

Performance, Value, and Versatility

Flexibility is the hallmark of ZYGO's NewView products. The NewView 9000 profiler offers exceptional value with applications as varied as flatness, roughness and waviness, thin films, step heights and more.

  • MORE INFO
  • Brochures &
    Spec Sheets
  • Application
    Notes
  • Manuals
  • TECH PAPERS
  • videos

All NewView 9000 profilers are equipped with a triple-zoom turret which can be populated with discrete zoom optics tailor made for the system. Sample staging configurations range from completely manual to fully automated with encoded travel.

Regardless of your configuration, all NewView 9000 systems offer high-accuracy measurements, ease of use, and fast measurements, all at an attractive price point that make it the ideal choice for versatility and value in 3D optical profilers.

Some of the differentiated features targeted at making users' metrology better, faster, and more reliable: 

  • Large-area 1.9 MP sensor with high sensitivity lets you see more in a single measurement
  • High-speed measurements take only seconds for improved productivity and process control
  • Automated part focus and setup minimizes operator variability and training while reducing the time to data
  • Gage-capable performance through exceptional precision and repeatability for the most demanding production applications.
  • Vibration robust metrology with SureScan technology and available built-in isolation enables high quality metrology even in vibration-prone environments
  • SmartPSI™ technology for ultra-fast profiling of ultra-smooth surfaces
  • 2D and 3D correlation provides confidence in your measurements with results that comply to ISO 25178 and ISO 4287 standards.
  • Mx™ software for instrument control, analysis, and measurement automation

Flexible Configurations

NewView 9000 Stage & Work AreaThe NewView 9000 profiler features an open work area, with clear lines of sight, to help make measurement setups and changeovers simple and quick. Systems can be equipped with a variety of sample staging that range from fully manual X/Y and tilt stages, to fully automated stages with 150 mm of travel and 4 degrees of tilt. With the integrated isolation system and compact size, it is well suited for benchtop installations; using the optional stand and workstation make an ideal production-style system.

 

img1
NewView™ 9000
img1
3D Optical Profiler Accessory Guide
img1
3D Optical Profilers
img1
Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
img1
NewView™ 9000
Title
Document
Download Link
NewView™ 9000
DocumentBrochure
Download Link Download
3D Optical Profiler Accessory Guide
DocumentBrochure
Download Link Download
3D Optical Profilers
DocumentBrochure
Download Link Download
Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
DocumentBrochure
Download Link Download
NewView™ 9000
DocumentSpecifications
Download Link Download
img1
Form and Roughness
img1
Mx™ Software Films Analysis
img1
Measuring Sub-Angstrom Surface Texture
img1
Measuring Dynamic MEMS Devices
img1
Identifying and Controlling Vibration
img1
PSD Analysis
img1
Vision Software Suite
img1
ABS Geometry and MetroPro® Calculations
Title
Document
Download Link
Form and Roughness
DocumentAB-0100
Download Link Download
Mx™ Software Films Analysis
DocumentAN-0001
Download Link Download
Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
Download Link Download
Measuring Dynamic MEMS Devices
DocumentAN-0003
Download Link Download
Identifying and Controlling Vibration
DocumentAN-0006
Download Link Download
PSD Analysis
DocumentAN-0009
Download Link Download
Vision Software Suite
DocumentAN-0011
Download Link Download
ABS Geometry and MetroPro® Calculations
DocumentAN-0012
Download Link Download
Getting the Most from the Advanced Texture Application
DocumentAN-0013
Download Link Download
Filtering on the NewView™
DocumentAN-0014
Download Link Download
img1
NewView™ 9000 CE DICHIARAZIONE DI CONFORMITÀ
img1
NewView™ 9000 Mode d’emploi
img1
NewView™ 9000 Bedienungsanleitung
img1
NewView™ 9000 Manuale di istruzioni
img1
NewView™ 9000 İşletim Kılavuzu
img1
Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
img1
NewView™ 9000 Operating Manual
img1
Mx™ Quick-Start Guide
Title
Document
Download Link
NewView™ 9000 CE DICHIARAZIONE DI CONFORMITÀ
DocumentZYG18-001 (Italian)
Download Link Download
NewView™ 9000 Mode d’emploi
DocumentOMP-0617A (French)
Download Link Download
NewView™ 9000 Bedienungsanleitung
DocumentOMP-0617A (German)
Download Link Download
NewView™ 9000 Manuale di istruzioni
DocumentOMP-0617A (Italian)
Download Link Download
NewView™ 9000 İşletim Kılavuzu
DocumentOMP-0617A (Turkish)
Download Link Download
Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594J
Download Link Download
NewView™ 9000 Operating Manual
DocumentOMP-0617A
Download Link Download
Mx™ Quick-Start Guide
DocumentOMP-0570D
Download Link Download
Mx™ Reference Guide
DocumentOMP-0550D
Download Link Download
Mx™ Remote Access Guide
DocumentOMP-0600A
Download Link Download
img1
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
img1
A new class of wide-field objectives for 3D interference microscopy
img1
Accurate, repetitive, linear motion from biased piezoelectric actuators
img1
Advanced Metrology for Energy Efficiency
img1
Advances in optical metrology
img1
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
img1
Applications of model-based transparent surface films analysis using coherence scanning interferometry
img1
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
Document
Download Link
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
Download Link Download
A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
Download Link Download
Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
Download Link Download
Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
Download Link Download
Advances in optical metrology
DocumentTechnical Paper
Download Link Download
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
Download Link Download
Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
Download Link Download
Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
Download Link Download

* Required entries
 Required for USA and Canada
Note:
If you experience any difficulty submitting this form, contact: webmaster@zygo.com

** You may withdraw this consent at any time using the "unsubscribe" link at the bottom of any page on this web site.
X
By continuing to use this site, you agree to our Privacy and Cookie Policy
OK