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最大限度地提高投资回报率
Nexview™ LS650 的设计和制造确保了系统在未来几年内都能提供巨大的价值。 Nexview™ LS650 的计量区域可容纳最大 650 x 650 mm 的横向尺寸和 负载> 100 kg 的样品，垂直范围为 150 mm，并有全封闭或半封闭系统选项，为三维光学轮廓仪精密测量大尺寸样品提供了最大的灵活性。
例如。该系统可容纳：
- 当今任何一种标准尺寸的 PCB 基板
- 为柔性片材等定制的样品架，它可部署在高负载的 Y 工作台上，而不必担心其重量问题
- 重型大注塑板，得益于精确的非接触式检测，潜在的精密表面损伤的风险被降到了最低
我们可以设计或提供定制的卡盘和样品架，使系统适用于较小的面板，甚至是被切割的基板，以最大限度地提高应用的灵活性。
该工作站系统集成的自动化测试软件可以对每个面板上的多个特征点按照指定的方向和顺序进行自动计量，减少了生产时间，加深了操作员对工艺的认识。
面形和粗糙度
Mx™ Software Films Analysis
Measuring Sub-Angstrom Surface Texture
Measuring Dynamic MEMS Devices
Identifying and Controlling Vibration
PSD Analysis
Vision Software Suite
ABS Geometry and MetroPro® Calculations
Getting the Most from the Advanced Texture Application
Filtering on the NewView™
Haze Controls Thin Film PV Performance
Photovoltaic Panel Measurement on a NewView™
Measuring with an Optical Diverter on a NewView
Measuring Honed Surfaces with a NewView
Diesel Fuel Injector Metrology
高坡度表面的光学剖面测量
标题
文件
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
A new class of wide-field objectives for 3D interference microscopy
Accurate, repetitive, linear motion from biased piezoelectric actuators
Advanced Metrology for Energy Efficiency
Advances in optical metrology
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
Applications of model-based transparent surface films analysis using coherence scanning interferometry
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
标题
文件
下载链接
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
Document技术论文
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
Document技术论文
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Document技术论文
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
Document技术论文
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